Estimation of leaf area index of banana orchards using the method LAI-LUX

Abstract

This paper aimed to compare leaf area index (LAI) from two genotypes banana orchards (Grand Naine and Tropical) estimated by biometric measurements with the LAI-LUX method. This method is based on measurements of radiation transmittance using a digital luximeter. There were under and overestimation of LAI using the LAI-LUX method. The measurements taken on orchards aged over 8 months have shown the mean relative error of -4.35% related to cultivar Tropical and +2.77% for the Grand Naine. The overall results revealed the underestimation of results by 3.85% when the ‘Grand Naine’ banana cultivar was analyzed and overestimation of 6.3% in the case of cultivar ‘Tropical’. These results have shown the potential to the practical use the method LAI-LUX to estimate LAI in banana orchards but are also necessary to improve the studies in new orchards (up to 8 months) for better understanding the main sources of error.